Delay line probes are used for thin materials, near-surface flaw detection and high-resolution inspection tasks. Sonatest designs these probes for versatility in metals, plastics and composites.

Featuring removable delay lines, these probes are ideal for thin-section testing, high-temperature surfaces and curved components. They offer improved near-surface detection and support a wide frequency range for precision applications.

• Thin-walled component inspection

• Near-surface flaw detection

• High-temperature surface measurement

• Plastic, rubber and composite testing

• Geometry-limited access areas

• Precision thickness measurement

• Typical Probe Sizes: 3–10 mm element sizes

•  Replaceable delay-line tips

• High-resolution pulse-echo performance

• Suitable for small-radius surfaces

• Lemo/BNC connector options

• Compatible with precision gauges and flaw detectors