The XEO instrument combines the latest phased‑array ultrasonic testing (PA‑UT) innovation with advanced portable computing technology, redefining performance standards in the ultrasonic non‑destructive testing market.

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Optimized for the future

The Sonatest XEO is designed to adapt to modern industry technologies and automation, it delivers the full capability of a high‑end system in a compact, field‑ready instrument. The XEO interface is the natural fit for all NDT inspectors.

Our instrument redefines complex UT and phased‑array imaging, turning advanced inspections into simple tasks.

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PHASED ARRAY

The instrument is capable of true geometry rendering with sectorial and linear scanning. This allows a comprehensive data reviewing.

With our 3D ray tracing, validate your configuration to ensure maximum coverage of your inspections.

Get fast and live images from one or many of the 16 propagation modes available on flat and curved parts.

The defect profile fidelity is key to characterisation.

With up to 4 megapixels per image, you will never miss a thing

Software Options

XEO 64:128 is an all‑inclusive model offered at a highly competitive price.

Start with the XEO 32:128 and add only the options required for your specific applications. The 32:128 model is designed for a “build‑your‑own instrument” approach.

Refer to the software part numbers below for more details.

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MULTIPLE TECHNIQUES

Using complementary techniques assures a higher detection rate of every defect. With XEO, Phased array, TFM, TOFD; all techniques can be used in the same configuration. For a complete inspection in only one scan, take advantage of the mini-dock flexibility.

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