TYPE32 probes are high-resolution phased array probes engineered for detailed flaw characterization and precision imaging. They are designed for applications where fine defect detection, tight focusing, and superior signal clarity are required.

A precision-oriented PAUT probe family offering higher frequencies, smaller element pitches, and enhanced focusing capability. TYPE32 probes excel in detecting small discontinuities, evaluating thin materials, and performing advanced imaging in automated or manual inspection setups.

• High-resolution weld inspection

• Thin material examination

• Crack detection and small flaw sizing

• Aerospace composite and metal component testing

• Precision manufacturing QA

• Automated PAUT using high-density array configurations

‍

• Typical Probe Sizes: 5–15 mm aperture; 32–128 element arrays

• Typical Weight: Lightweight PAUT micro-housing

• Higher frequencies for enhanced resolution (up to 10–15 MHz depending on model)

• Fine element pitch for tight focusing and improved imaging

• Ideal for thin sections, small features, and critical components

• Compatible with a wide range of wedges and scanning frames

• Supports advanced PAUT techniques including sectorial and linear scanning